Patents

 

1. “Uniform, Non-disruptive, and Radiometrically Accurate Calibration of Infrared Focal-Plane Arrays Using Global Scene Motion,” B. Ratliff, M. M. Hayat, J. S. Tyo and T. Turner, U.S. Patent 7,132,648; 2006.

2. “Spectrally Adaptive Quantum Dot Infrared Sensors for Focal Plane Arrays,” S. Krishna, M. M. Hayat, J. S. Tyo, U. Sakoglu, and S. Raghavan, United States Patent No. 7,217,951, May 2007.

3. “Intersubband detector with avalanche multiplier region,” S. Krishna, J.P.R. David, and M. M. Hayat, United States Patent No. 7,271,405, Sep. 2007.

4. “System and Method for Reduction of Speckle Noise in an Image,” O. Lankoande, M. M. Hayat and B. Santhanam, United States Patents No. 7,961,975, issued June 14, 2011.

5. “System and Method for Reduction of Speckle Noise in an Image,” O. Lankoande, M. M. Hayat and B. Santhanam, United States Patents No. 8,184,927, issued 2012.

6. “System and Method for Reduction of Speckle Noise in an Image,” (O. Lankoande, M. M. Hayat and B. Santhanam, United States Patents No. 8,208,724, issued 2012.

7. “Infrared Retina,” S. Krishna, M. M. Hayat, W-Y Jang, and J. S. Tyo United States Patent No. 8,071,945 B2, Dec.\ 2011.

8. “Detector with Tunable Spectral Response,” (S. Krishna, M. M. Hayat, J. S. Tyo, S. Raghavan, and U. Sakoglu, United States Patent No. 8,134,141, March 13, 2012.

9. “Lens-less digital microscope,” (with S. Hersee and P. Sen), United States Patent No. 8,624,968 B1, January 7, 2014.

10. “Spectral Ratio Contrast for Edge Detection in Spectral Images,” United States Patent 8,649,607, M. M. Hayat, S. Krishna, and B. S. Paskaleva [Hayat’s student], February 2014.

11. “Method and System for Feature Extraction and Decision Making from Series of Images,” United States Patent US-2015-0187068-A1 S. Krishna, S. Krishna, M. M. Hayat, P. Sen, S. Godoy (Hayat’s student), A. Barve, July 2015.

12. “Impact Ionization Devices Under Dynamic Electric Fields.” M. M. Hayat, D. A. Ramirez, J. P. David, L. Lester, S. Krishna, and P. Zarkesh-Ha, U.S. Patent 9,354,113, May 2016. (Licensed.)

13. “Material classification fused with spatio-spectral edge detection in spectral imagery,” Majeed M. Hayat, Sanjay Krishna, Sebastian Godoy, U.S. Patent 9,430,842, August 2016.